Topographic and crystallographic characterization of a grazing-ion-bombarded GaAs(110) surface by time-of-flight ion-scattering spectrometry
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.56.4186/fulltext
Reference30 articles.
1. Low-energy ion scattering at surfaces
2. Low energy ion scattering and recoiling
3. Surface modification of GaAs(110) by low-energy ion irradiation
4. Vacancy kinetics and sputtering of GaAs(110)
5. Atom-scattering study of Ar+ ion damaged GaAs(110)
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