X-ray study of atomic correlations inZn0.5Cd0.5Se0.5Te0.5epitaxial thin films
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.55.9910/fulltext
Reference20 articles.
1. Stability of the wurtzite-type structure under high pressure: GaN and InN
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3. Alloy disorder effects on the electronic properties of III-V quaternary semiconductor alloys
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