Reflection of light at a flat interface under normal incidence: A renewed macroscopic description
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.40.10231/fulltext
Reference22 articles.
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2. Discrete structure of ultrathin dielectric films and their surface optical properties;Physical Review B;2002-02-22
3. Superresolution of near-field optical microscopy defined from properties of confined electromagnetic waves;Applied Optics;1992-06-01
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5. Model for scanning tunneling optical microscopy: A microscopic self-consistent approach;Physical Review B;1990-11-15
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