Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.87.081408/fulltext
Reference13 articles.
1. A novel method achieving ultra-high geometrical resolution in scanning tunnelling microscopy
2. Single Molecule and Single Atom Sensors for Atomic Resolution Imaging of Chemically Complex Surfaces
3. Imaging Pauli Repulsion in Scanning Tunneling Microscopy
4. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
5. Advances in atomic force microscopy
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