In situTEM observation of controlled gold contact failure under electric bias
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.87.081404/fulltext
Reference23 articles.
1. Study of conductive gold film lifetime under high current densities
2. Analysis of failure mechanisms in electrically stressed Au nanowires
3. Formation and manipulation of a metallic wire of single gold atoms
4. Conductance of atomic-scale gold contacts under high-bias voltages
5. Bias dependence of the conductance of Au nanocontacts
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2. Atomic scale mechanics explored by in situ transmission electron microscopy with a quartz length-extension resonator as a force sensor;Nanotechnology;2020-02-28
3. Mechanical analysis of gold nanocontacts during stretching using an in-situ transmission electron microscope equipped with a force sensor;Applied Physics Express;2020-01-21
4. Electromigration and the structure of metallic nanocontacts;Applied Physics Reviews;2017-09
5. Formation and properties of metallic atomic contacts;Physics-Uspekhi;2015-10-31
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