Multiphoton photoemission and electric-field-induced optical second-harmonic generation as probes of charge transfer across theSi/SiO2interface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.2164/fulltext
Reference55 articles.
1. Hot-carrier effects in scaled MOS devices
2. Characterization of as‐grown and annealed thin SiO2 films formed in 0.1 M HCl
3. Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
4. Transient charging and slow trapping in ultrathin SiO2 films on Si during electron bombardment
5. Electron Photoinjection from Silicon to Ultrathin SiO2Films via Ambient Oxygen
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