Electronic states of Ag thin films with a laterally periodic insertion of stacking faults
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.81.155418/fulltext
Reference27 articles.
1. One-Dimensional Surface Reconstruction as an Atomic-Scale Template for the Growth of Periodically Striped Ag Films
2. Structure determination of the indium-inducedSi(111)−(4×1)reconstruction by surface x-ray diffraction
3. Atomic geometry, electronic structure and image state for the Si(111)–In(4×1) nanowire
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