Bulk changes in semiconductors using scanning probe microscopy: nm-size fabricated structures
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.10877/fulltext
Reference15 articles.
1. Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions
2. Quantification of nanospreading resistance profiling data
3. Nanometre-scale chemical modification using a scanning tunnelling microscope
4. Nanometre-scale recording and erasing with the scanning tunnelling microscope
5. Fabrication of sub-μm bipolar transistor structures by scanning probe microscopy
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