Ordered and disordered models of local structure around Ag cations in silver borate glasses based on x-ray absorption near-edge structure spectroscopy
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.69.134201/fulltext
Reference57 articles.
1. Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure
2. X-ray absorption near-edge structure calculations beyond the muffin-tin approximation
3. Geometrical fitting of experimental XANES spectra by a full multiple-scattering procedure
4. Quantitative Analysis of X-Ray Absorption Near Edge Structure Data by a Full Multiple Scattering Procedure: The Fe-CO Geometry in Photolyzed Carbonmonoxy-Myoglobin Single Crystal
5. TheMXANprocedure: a new method for analysing the XANES spectra of metalloproteins to obtain structural quantitative information
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