Resonant electron injection as an atomic-scale tool for surface studies
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.66.195403/fulltext
Reference20 articles.
1. Scanning tunneling microscopy of semiconductor surfaces
2. Atomic-scale imaging of insulating diamond through resonant electron injection
3. Near field emission scanning tunneling microscopy
4. Particle in a variable-size box: The influence of the tip in thin-film electron interferometry
5. Tunneling Spectroscopy and Inverse Photoemission: Image and Field States
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3. Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy;Journal of Applied Physics;2009-09
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