Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.38.5547/fulltext
Reference35 articles.
1. New soft x‐ray emission spectrograph
2. Inelastic electron scattering spectrometer
3. Soft-x-ray emission spectroscopy study of the electronic structure of nonstoichiometric silicon nitride
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