Charge transfer in secondary-ion emission: Tight-binding studies in Si and Si:O clusters
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.35.8330/fulltext
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5. Model of ionization of atoms sputtered from solids
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1. Resonant Charge Exchange in Atom Scattering on Atoms Adsorbed on Metal Surfaces;Acta Physica Polonica A;2002-06
2. Perturbative treatment of electronic correlations in time-dependent collision processes;Journal of Physics: Condensed Matter;1996-10-07
3. Secondary ion emission from silicon under 8 keV O2+ and Ar+ ion bombardment;Vacuum;1996-02
4. Charge exchange in many-body time-dependent processes;Physical Review B;1992-04-15
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