Electronic structure of dangling bonds in amorphous silicon studied via a density-matrix functional method
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.66.195213/fulltext
Reference21 articles.
1. Surface reconstruction and lattice dynamics of hydrogenated Si(001):2×1
2. Electronic structure of dangling and floating bonds in amorphous silicon
3. Energy levels and charge distributions of nonideal dangling and floating bonds in amorphous Si
4. Defects ina−Sianda−Si:H: A numerical study
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