Resonant inelastic x-ray scattering study of Bi6Fe2Ti3O18, Bi6FeCoTi3O18 , and LaBi5FeCoTi3O18 Aurivillius-phase oxides-Reference-Cited by-同舟云学术

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Resonant inelastic x-ray scattering study of Bi6Fe2Ti3O18, Bi6FeCoTi3O18 , and LaBi5FeCoTi3O18 Aurivillius-phase oxides

Published:2017-05-03 Issue:20 Volume:95 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Cui Zhangzhang,Zhai Xiaofang,Chuang Yi-De,Xu Hui,Huang Haoliang,Wang Jianlin,Fu Zhengping,Peng Ranran,Guo Jinghua,Lu Yalin

Funder

Chinese Academy of Sciences

U.S. Department of Energy

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.95.205102/fulltext

Reference37 articles.

1. Multiferroic properties of layer-structured Bi5Fe0.5Co0.5Ti3O15 ceramics

2. A Novel Class of Multiferroic Material, Bi4 Ti3 O12 ·n BiFeO3 with Localized Magnetic Ordering Evaluated from Their Single Crystals

3. Mechanical force involved multiple fields switching of both local ferroelectric and magnetic domain in a Bi5Ti3FeO15 thin film

4. Growth of single-crystalline Bi6FeCoTi3O18 thin films and their magnetic–ferroelectric properties

5. Octahedral Rotation-Induced Ferroelectricity in Cation Ordered Perovskites

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1. Development of low band gap layered Bi6FeNiTi3O18 aurivillius phase ceramics for ferroelectric memory and cathode for lithium-oxygen batteries applications;Journal of Materials Science: Materials in Electronics;2024-02

2. Origin of itinerant carriers in antiferromagnetic LaFe1−xMoxO3 studied by x-ray spectroscopies;Physical Review Materials;2020-03-13

3. Accelerating hydrogen evolution in Ru-doped FeCoP nanoarrays with lattice distortion toward highly efficient overall water splitting;Catalysis Science & Technology;2020

4. Magnetic, dielectric and optical properties of five-layered Aurivillius phase Bi6Fe2Ti3O18-based ceramics;Current Applied Physics;2019-12

5. Weak magnetism of Aurivillius-type multiferroic thin films probed by polarized neutron reflectivity;Physical Review Materials;2018-04-27

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