Measurement of the electron yield of CsI with polarized x rays-Reference-Cited by-同舟云学术

Measurement of the electron yield of CsI with polarized x rays

Published:1993-07-01 Issue:2 Volume:48 Page:701-709
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Hanany S.,Shaw P. S.,Liu Y.,Santangelo A.,Kaaret P.,Novick R.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.701/fulltext

Reference26 articles.

1. The characterization of x‐ray photocathodes in the 0.1–10‐keV photon energy region

2. Electron emission from alkali halides under soft x-ray bombardment

3. Weitere lichtelectrische Versuche

4. Lichtelectrische Untersuchungen an polarisirtem Lichte

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. General History of X-ray Polarimetry in Astrophysics;Handbook of X-ray and Gamma-ray Astrophysics;2024

2. General History of X-Ray Polarimetry in Astrophysics;Handbook of X-ray and Gamma-ray Astrophysics;2022-09-23

3. Astronomical X-ray polarimetry based on photoelectric effect with microgap detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-08

4. The X-ray vectorial effect revisited;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-11

5. In situ probing of the near-surface properties of heterogeneous catalysts under reaction conditions: An introduction to total electron-yield XAS;Journal of Molecular Catalysis A: Chemical;1997-05