Revealing electromigration on dielectrics and metals through the step-bunching instability-Reference-Cited by-同舟云学术

Revealing electromigration on dielectrics and metals through the step-bunching instability

Published:2020-07-06 Issue:3 Volume:102 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Usov Victor^ORCID,Coileáin Cormac Ó,Chaika Alexander N.,Bozhko Sergey I.,Semenov Valery N.^ORCID,Krasnikov Sergey^ORCID,Toktarbaiuly Olzat,Stoyanov Stoyan,Shvets Igor V.

Funder

Irish Research Council

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.102.035407/fulltext

Reference103 articles.

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4. Multi-terminal memtransistors from polycrystalline monolayer molybdenum disulfide

5. Cathodic electrodeposition of ceramic and organoceramic materials. Fundamental aspects

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