Conductivity, plasmon, and cyclotron-resonance anomalies in Si(100) metal-oxide-semiconductor systems
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.32.4014/fulltext
Reference58 articles.
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2. Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit
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