Search for fractional-charge impurities in semiconductors with photothermal ionization spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.30.3374/fulltext
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Search for fractional-charge impurities in silicon using infrared photoionization and field ionization;Physical Review Letters;1993-02-22
2. Electronic properties of hydrogen-related complexes in pure semiconductors;Physica B: Condensed Matter;1991-04
3. Chapter 11 Hydrogen-Related Phenomena in Crystalline Germanium;Semiconductors and Semimetals;1991
4. Defect Identification in High-Purity Semiconductors;MRS Proceedings;1985
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