Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties-Reference-Cited by-同舟云学术

Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties

Published:2018-06-22 Issue:23 Volume:97 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Bocquet Franck,Nony Laurent,Para Franck,Luangprasert Philipda,Naubron Jean-Valère,Loppacher Christian,Leoni Thomas,Thomas Anthony,Ranguis Alain,d'Aléo Anthony,Fages Frédéric,Becker Conrad

Funder

Agence Nationale de la Recherche

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.97.235434/fulltext

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