Symmetry analysis and uniaxial-stress effect on the low-field electroreflectance of Si from 3.0 to 4.0 eV
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.14.1577/fulltext
Reference77 articles.
1. Franz-Keldysh Effect above the Fundamental Edge in Germanium
2. Field Effect of the Reflectivity in Germanium
3. Franz-Keldysh Effect of the Refractive Index in Semiconductors
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