Imaging ofc(8×2)∕(4×6)GaAs(001)surface with noncontact atomic force microscopy
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.71.165419/fulltext
Reference39 articles.
1. GaAs(001) Surface under Conditions of Low As Pressure: Evidence for a Novel Surface Geometry
2. Subsurface Dimerization in III-V Semiconductor (001) Surfaces
3. Atomic Structure of InSb(001) and GaAs(001) Surfaces Imaged with Noncontact Atomic Force Microscopy
4. Direct Imaging of theInSb(001)−c(8×2)Surface: Evidence for Large Anisotropy of the Reconstruction
5. Structures of the Ga-Rich4×2and4×6Reconstructions of the GaAs(001) Surface
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3. Noncontact atomic force microscopy and density functional theory studies of the (2×2) reconstructions of the polar AlN(0001) surface;Physical Review B;2016-10-17
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