Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection-Reference-Cited by-同舟云学术

Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection

Published:2022-11-03 Issue:9 Volume:106 Page:
ISSN:2470-0010
Container-title:Physical Review D
language:en
Short-container-title:Phys. Rev. D

Author:

Norcini D.^ORCID,Castelló-Mor N.,Baxter D.,Corso N. J.,Cuevas-Zepeda J.,De Dominicis C.,Matalon A.,Munagavalasa S.,Paul S.,Privitera P.,Ramanathan K.,Smida R.,Thomas R.,Yajur R.,Chavarria A. E.,McGuire K.,Mitra P.,Piers A.,Settimo M.,Gutiérrez J. Cortabitarte,Duarte-Campderros J.,Lantero-Barreda A.,Lopez-Virto A.,Vila I.,Vilar R.,Avalos N.,Bertou X.,Dastgheibi-Fard A.,Deligny O.,Estrada E.,Gadola N.,Gaïor R.,Hossbach T.,Khalil L.,Kilminster B.,Lawson I.,Lee S.,Letessier-Selvon A.,Loaiza P.,Papadopoulos G.,Robmann P.,Traina M.,Warot G.,Zopounidis J-P.,

Funder

H2020 European Research Council

National Science Foundation

University of Chicago

University of Washington

Kavli Foundation

Blond McIndoe Research Foundation

Agencia Estatal de Investigación

Agencia Nacional de Promoción Científica y Tecnológica

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Office of Science

U.S. Department of Energy