Insights into the atomic structure of the interface of ferroelectric Hf0.5Zr0.5O2 grown epitaxially on La2/3Sr1/3MnO3-Reference-Cited by-同舟云学术

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Insights into the atomic structure of the interface of ferroelectric Hf0.5Zr0.5O2 grown epitaxially on La2/3Sr1/3MnO3

Published:2021-07-28 Issue:7 Volume:5 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Estandía Saúl^ORCID,Cao Tengfei,Mishra Rohan^ORCID,Fina Ignasi,Sánchez Florencio^ORCID,Gazquez Jaume

Funder

Ministerio de Ciencia, Innovación y Universidades

Federación Española de Enfermedades Raras

Ministerio de Economía, Industria y Competitividad, Gobierno de España

Generalitat de Catalunya

Ministerio de Economía y Competitividad

Universitat Autònoma de Barcelona

Oak Ridge National Laboratory

U.S. Department of Energy

National Science Foundation

Fundación BBVA

Ramón y Cajal

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.5.074410/fulltext

Reference47 articles.

1. Scale-free ferroelectricity induced by flat phonon bands in HfO2

2. Enhanced ferroelectricity in ultrathin films grown directly on silicon

3. Critical thickness for ferroelectricity in perovskite ultrathin films

4. Ferroelectricity in hafnium oxide thin films

5. Magnetic Tunnel Junctions Based on Ferroelectric Hf0.5Zr0.5O2 Tunnel Barriers

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Phase Stability and Phase Transition Pathways in the Rhombohedral Phase of HfO₂;The Journal of Physical Chemistry Letters;2024-09-05

2. Stabilizing the Ferroelectric Phase of Hf0.5Zr0.5O2 Thin Films by Charge Transfer;Physical Review Letters;2024-07-18

3. Ferroelectric freestanding hafnia membranes with metastable rhombohedral structure down to 1-nm-thick;Nature Communications;2024-06-25

4. Phase transitions in HfO2 probed by first-principles computations;Journal of Applied Physics;2024-02-01

5. Epitaxial Hf0.5Zr0.5O2 films: A temperature dependence study;Applied Physics Letters;2024-01-29

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