International comparison on SST and Epstein measurements in grain-oriented Fe-Si sheet steel-Reference-Cited by-同舟云学术

International comparison on SST and Epstein measurements in grain-oriented Fe-Si sheet steel

Published:2015-06-30 Issue:2,3 Volume:48 Page:123-133
ISSN:1383-5416
Container-title:International Journal of Applied Electromagnetics and Mechanics
language:
Short-container-title:JAE

Author:

Appino C.¹,Ferrara E.¹,Fiorillo F.¹,Rocchino L.¹,Ragusa C.²,Sievert J.³,Belgrand T.⁴,Wang C.⁵,Denke P.⁶,Siebert S.⁶,Norgren Y.⁷,Gramm K.⁷,Norman S.⁸,Lyke R.⁸,Albrecht M.⁹,Zhou X.¹⁰,Fan W.¹¹,Guo X.¹²,Hall M.¹³

Affiliation:

1. INRIM, Torino, Italy

2. Politecnico di Torino, Torino, Italy

3. PTB (former affiliation), Braunschweig, Germany

4. TKES, Isbergues, France

5. TKES, Gelsenkirchen, Germany

6. BROCKHAUS Messtechnik, Lüdenscheid, Germany

7. ABB, Ludvika, Sweden

8. AK Steel, Middletown, CT, USA

9. PTB, Braunschweig, Germany

10. BAOSTEEL, Shanghai, China

11. NIM, Beijing, China

12. WISCO, Wuhan, Hubei, China

13. NPL, Teddington, UK

Publisher

IOS Press

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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