Dynamic mutual information-based feature selection for multi-label learning

Author:

Kim Kyung-Jun,Jun Chi-Hyuck

Abstract

In classification problems, feature selection is used to identify important input features to reduce the dimensionality of the input space while improving or maintaining classification performance. Traditional feature selection algorithms are designed to handle single-label learning, but classification problems have recently emerged in multi-label domain. In this study, we propose a novel feature selection algorithm for classifying multi-label data. This proposed method is based on dynamic mutual information, which can handle redundancy among features controlling the input space. We compare the proposed method with some existing problem transformation and algorithm adaptation methods applied to real multi-label datasets using the metrics of multi-label accuracy and hamming loss. The results show that the proposed method demonstrates more stable and better performance for nearly all multi-label datasets.

Publisher

IOS Press

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Theoretical Computer Science

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