An improved semi-supervised learning method for software defect prediction-Reference-Cited by-同舟云学术

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An improved semi-supervised learning method for software defect prediction

Published:2014 Issue:5 Volume:27 Page:2473-2480
ISSN:1064-1246
Container-title:Journal of Intelligent & Fuzzy Systems
language:
Short-container-title:

Author:

Ma Ying¹,Pan Weiwei²,Zhu Shunzhi¹,Yin Huayi¹³,Luo Jian³

Affiliation:

1. School of Computer Sciences and Information Engineering, Xiamen University of Technology, Xiamen, China

2. School of Applied Mathematics, Xiamen University of Technology, Xiamen, China

3. School of Information Sciences and Engineering, Xiamen University, Xiamen, China

Publisher

IOS Press

Subject

Artificial Intelligence,General Engineering,Statistics and Probability

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Integrated Semi-supervised Software Defect Prediction Model;網際網路技術學刊;2023-11

2. Cross-Project Defect Prediction;Intelligent Software Defect Prediction;2023

3. Data quality issues in software fault prediction: a systematic literature review;Artificial Intelligence Review;2022-12-21

4. Semi-supervised Software Defect Prediction Model Based on Tri-training;KSII Transactions on Internet and Information Systems;2021-11-30

5. Effective software defect prediction using support vector machines (SVMs);International Journal of System Assurance Engineering and Management;2021-09-14

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