Application of EMAT/EC dual probe to monitoring of wall thinning in high temperature environment-Reference-Cited by-同舟云学术

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Application of EMAT/EC dual probe to monitoring of wall thinning in high temperature environment

Published:2010-10-08 Issue:3-4 Volume:33 Page:1317-1327
ISSN:1875-8800
Container-title:International Journal of Applied Electromagnetics and Mechanics
language:
Short-container-title:JAE

Author:

Urayama Ryoichi¹,Uchimoto Tetsuya¹,Takagi Toshiyuki¹

Affiliation:

1. Institute of Fluid Science, Tohoku University, 2-1-1, Katahira, Aoba, Sendai 980-8577, Japan

Publisher

IOS Press

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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