Application of dimensional analysis to ECT in the era of NDE 4.0

Author:

Tamburrino Antonello1,Sardellitti Alessandro1,Milano Filippo1,Mottola Vincenzo1,Laracca Marco2,Ferrigno Luigi1

Affiliation:

1. , University of Cassino and Southern Lazio, Italy

2. , Sapienza University of Rome, Italy

Abstract

This paper introduces Buckingham’s 𝜋 theorem in the context of Non-Destructive Testing & Evaluation (NDT&E). Its application leads to easier problems to handle by reducing the number of variables involved. In this sense, dimensional analysis can provide the foundation for in-line, real-time and low-cost inspection methods that are fully compatible with the requirements of the Industry 4.0 and NDE 4.0 paradigms. In order to show the impact of the Buckingham’s 𝜋 theorem in NDT&E, we consider a practical case of interest, i.e. the simultaneous estimation of thickness and electrical conductivity of metallic plates via Eddy Current Testing. An initial numerical analysis is carried out with the aim to show the metrological performance of the method. The results obtained show that the method combines good accuracy with low computational costs.

Publisher

IOS Press

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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