Application of silicon micro hall sensors in variable temperature scanning hall probe microscopy (SHPM) using multiple feedback techniques
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Published:2018-06
Issue:6
Volume:5
Page:70-78
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ISSN:2313-626X
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Container-title:International Journal of ADVANCED AND APPLIED SCIENCES
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language:
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Short-container-title:Int. j. adv. appl. sci.
Publisher
International Journal of Advanced and Applied Sciences
Subject
Multidisciplinary