Abstract
Non-destructive and online defect detection on seals is increasingly being deployed in packaging processes, especially for food and pharmaceutical products. It is a key control step in these processes as it curtails the costs of these defects.
To address this cause, this paper highlights a combination of two cost-effective methods, namely machine learning algorithms and infrared thermography. Expectations can, however, be restricted when the training data is small, unbalanced, and subject to optical imperfections.
This paper proposes a classification method that tackles these limitations. Its accuracy exceeds 93% with two small training sets, including 2.5 to 10 times fewer negatives. Its algorithm has a low computational cost compared to deep learning approaches, and does not need any prior statistical studies on defects characterization.
Publisher
Universitat Autonoma de Barcelona
Subject
Computer Vision and Pattern Recognition,Software
Cited by
4 articles.
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