Scanning probe microscopy and related methods
Author:
Publisher
Beilstein Institut
Subject
Electrical and Electronic Engineering,General Physics and Astronomy,General Materials Science
Link
https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-1-18.pdf
Reference10 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
2. Atomic Force Microscope
3. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
4. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
5. Velocity Dependence of Atomic Friction
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