Rationalizing energy level alignment by characterizing Lewis acid/base and ionic interactions at printable semiconductor/ionic liquid interfaces-Reference-Cited by-同舟云学术

Rationalizing energy level alignment by characterizing Lewis acid/base and ionic interactions at printable semiconductor/ionic liquid interfaces

Published:2022 Issue:1 Volume:9 Page:471-481
ISSN:2051-6347
Container-title:Materials Horizons
language:en
Short-container-title:Mater. Horiz.

Author:

Du Hill Linze¹,De Keersmaecker Michel¹²^ORCID,Colbert Adam E.³^ORCID,Hill Joshua W.¹,Placencia Diogenes³,Boercker Janice E.³^ORCID,Armstrong Neal R.²^ORCID,Ratcliff Erin L.¹²⁴^ORCID

Affiliation:

1. Department of Chemical and Environmental Engineering, University of Arizona, 1133 E. James E. Rogers Way, Tucson, AZ 85721, USA

2. Department of Chemistry and Biochemistry, University of Arizona, 1306 E. University Blvd., Tucson, AZ 85721, USA

3. US. Naval Research Laboratory, 4555 Overlook Ave SW, Washington, DC. 20375, USA

4. Department of Materials Science and Engineering, University of Arizona, 1235 E. James E. Rogers Way, Tucson, AZ 85721, USA

Abstract

Chemical and ionic interactions between an ionic liquid and printable semiconductors are probed by photoelectron spectroscopy, with increasing reactivity associated with underlying defects from P3HT to NiOx to PbS/PbIx quantum dots to MAPbI3.

Funder

National Research Council

Office of Naval Research

Basic Energy Sciences

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrical and Electronic Engineering,Process Chemistry and Technology,Mechanics of Materials,General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2022/MH/D1MH01306H

Reference67 articles.

1. Interface Engineering for Organic Electronics