Fingerprints of native defects in monolayer PbTe-Reference-Cited by-同舟云学术

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Fingerprints of native defects in monolayer PbTe

Published:2019 Issue:2 Volume:1 Page:513-521
ISSN:2516-0230
Container-title:Nanoscale Advances
language:en
Short-container-title:Nanoscale Adv.

Author:

Ekuma C. E.¹²³^ORCID

Affiliation:

1. U.S. Army Research Laboratory

2. Aberdeen Proving Ground

3. USA

Abstract

Understanding the intricate interplay of defects and electron–electron interactions is crucial to exploiting the full potential of materials for practical applications.

Funder

Army Research Laboratory

Publisher

Royal Society of Chemistry (RSC)

Subject

General Engineering,General Materials Science,General Chemistry,Atomic and Molecular Physics, and Optics,Bioengineering

Link

http://pubs.rsc.org/en/content/articlepdf/2019/NA/C8NA00125A

Reference78 articles.

1. Impurity and vacancy states in PbTe

2. The electronic and optical properties of the lead sulphide group of semi-conductors

3. Scattering of Current Carriers and Transport Phenomena in Lead Chalcogenides II. Experiment

4. Defects in PbTe single crystals

5. Optical properties of PbTe and PbSe

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