Differentiating between long and short range disorder in infra-red spectra: on the meaning of “crystallinity” in silica

Author:

Asscher Yotam12345ORCID,Dal Sasso Gregorio12345,Nodari Luca6784,Angelini Ivana92104,Boffa Ballaran Tiziana11121314,Artioli Gilberto12345

Affiliation:

1. Department of Geosciences

2. University of Padova

3. Padova 35131

4. Italy

5. CIRCe – Center for the Investigation of Cement Materials

6. CNR-ICMATE

7. Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia

8. Padova 35127

9. Department of Cultural Heritage

10. Padova 35139

11. Bayerisches Geoinstitut

12. Universitaet Bayreuth

13. Bayreuth 95440

14. Germany

Abstract

Local atomic disorder and crystallinity are structural properties that can be assessed in the crystals of quartz based on particle-size-related scattering processes in transmission infra-red spectroscopy.

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Reference57 articles.

1. Fundam. Crystallogr., International Union of Crystallography Monographs on Crystallography, ed. C. Giacovazzo, Oxford University Press, 2011

2. J. H. Crawford and L. M.Slifkin, Point Defects in Solids: General and ionic crystals, Plenum Press, New York-London, 1972

3. Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

4. R. L. Snyder , H. J.Bunge and J.Fiala, Defect and microstructure analysis by diffraction, International Union of Crystallography Monographs on Crystallography, Oxford University Press, 1999

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

全球学者库

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"全球学者库"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前全球学者库共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2023 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3