Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities-Reference-Cited by-同舟云学术

Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities

Published:2020 Issue:11 Volume:7 Page:2832-2859
ISSN:2051-6347
Container-title:Materials Horizons
language:en
Short-container-title:Mater. Horiz.

Author:

Li Weiwei¹²³⁴^ORCID,Shi Jueli⁵⁶⁷⁸,Zhang Kelvin H. L.⁵⁶⁷⁸^ORCID,MacManus-Driscoll Judith L.¹²³⁴

Affiliation:

1. Department of Materials Science and Metallurgy

2. University of Cambridge

3. Cambridge

4. UK

5. State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering

6. Xiamen University

7. Xiamen 361005

8. China

Abstract

This review focuses on recent progress in defect-engineered novel functionalities of complex oxide thin films for electronics and energy applications, and current challenges and perspectives.

Funder

Royal Academy of Engineering

Engineering and Physical Sciences Research Council

Isaac Newton Trust

National Natural Science Foundation of China

European Research Council

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrical and Electronic Engineering,Process Chemistry and Technology,Mechanics of Materials,General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2020/MH/D0MH00899K

Reference379 articles.

1. New approaches for achieving more perfect transition metal oxide thin films

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4. Superconductivity in Semiconducting SrTiO3

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