Towards high-throughput exciton diffusion rate prediction in molecular organic semiconductors-Reference-Cited by-同舟云学术

Towards high-throughput exciton diffusion rate prediction in molecular organic semiconductors

Published:2024 Issue:24 Volume:12 Page:8747-8758
ISSN:2050-7526
Container-title:Journal of Materials Chemistry C
language:en
Short-container-title:J. Mater. Chem. C

Author:

Weal Geoffrey R.¹²³⁴^ORCID,Sutton Joshua J.¹²,Wechwithayakhlung Chayanit³⁴^ORCID,Packwood Daniel M.³⁴,Hodgkiss Justin M.¹²⁴^ORCID,Hume Paul A.¹²⁴^ORCID

Affiliation:

1. School of Chemical and Physical Sciences, Victoria University of Wellington, Wellington, 6010, New Zealand

2. MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, 6010, New Zealand

3. Institute for Integrated Cell-Material Sciences (iCeMS), Kyoto University, Kyoto, Japan

4. Center for Integrated Data-Material Sciences (iDM), MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, New Zealand

Abstract

Accurate property prediction is paramount to high-throughput screening of organic photovoltaics. Here, the accuracy of predicting exciton diffusion computationally is examined, and several simplifications towards high-throughput screening are explored.

Funder

Marsden Fund

MacDiarmid Institute for Advanced Materials and Nanotechnology

Kyoto University

Japan Society for the Promotion of Science

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/TC/D4TC00737A

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