Quantitative accuracy assessment of trace elements and halogens in apatite by time-of-flight secondary ion mass spectrometry (TOF-SIMS)-Reference-Cited by-同舟云学术

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Quantitative accuracy assessment of trace elements and halogens in apatite by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Published:2024 Issue:6 Volume:39 Page:1609-1615
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Wang Meng-Qin¹^ORCID,Cai Ke-Da¹,Li Zhan-Ping²^ORCID,Guo Chong³

Affiliation:

1. School of Earth Science Resources, State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Beijing 100083, China

2. Department of Chemistry, Key Laboratory of Organic Optoelectronics and Molecular Engineering of Ministry of Education, Tsinghua University, Beijing 100084, China

3. Analysis Center, Tsinghua University, Beijing 100084, China

Abstract

The first quantitative accuracy assessment of trace elements and halogens in apatite measured by TOF-SIMS.

Funder

National Key Research and Development Program of China

Publisher

Royal Society of Chemistry (RSC)

Link

http://pubs.rsc.org/en/content/articlepdf/2024/JA/D4JA00034J

Reference40 articles.

1. Apatite in Igneous Systems

2. The unroofing of Archean crustal domes as recorded by detrital zircon and apatite

3. Structurally Robust, Chemically Diverse: Apatite and Apatite Supergroup Minerals

4. Compositions of the Apatite-Group Minerals: Substitution Mechanisms and Controlling Factors

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