Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect-Reference-Cited by-同舟云学术

Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect

Published:2019 Issue:5 Volume:34 Page:906-914
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Liu Yu¹²³⁴⁵^ORCID,Li Xian-Hua¹²³⁴⁵^ORCID,Tang Guo-Qiang¹²³⁴⁵^ORCID,Li Qiu-Li¹²³⁴⁵^ORCID,Liu Xiao-Chi¹²³⁴⁵,Yu Hui-Min⁶⁷⁸⁵,Huang Fang⁶⁷⁸⁵^ORCID

Affiliation:

1. State Key Laboratory of Lithospheric Evolution

2. Institute of Geology and Geophysics

3. Chinese Academy of Sciences

4. Beijing 100029

5. China

6. CAS Key Laboratory of Crust-Mantle Materials and Environments

7. School of Earth and Space Sciences

8. University of Science and Technology of China

Abstract

During very high precision analyses using SIMS, sample surface flatness is one of the major factors in degradation of external analytical repeatability. An additional correction using a secondary ion beam centering parameter (DTCA-X) was used to minimize this. External precision and accuracy were improved.

Funder

National Natural Science Foundation of China

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2019/JA/C8JA00431E

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