C–F and C–H bond cleavage mechanisms of trifluoromethane ions in low-lying electronic states: threshold photoelectron–photoion coincidence imaging and theoretical investigations-Reference-Cited by-同舟云学术

C–F and C–H bond cleavage mechanisms of trifluoromethane ions in low-lying electronic states: threshold photoelectron–photoion coincidence imaging and theoretical investigations

Published:2020 Issue:24 Volume:22 Page:13808-13817
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Chen Yan¹²³⁴⁵^ORCID,Yu Tongpo⁴⁵⁶⁷³,Wu Xiangkun⁴⁵⁶⁷³,Zhou Xiaoguo⁴⁵⁶⁷³^ORCID,Liu Shilin⁴⁵⁶⁷³^ORCID,Liu Fuyi⁸⁶⁹³,Dai Xinhua¹²³

Affiliation:

1. National Institute of Metrology

2. Beijing 100013

3. China

4. Hefei National Laboratory for Physical Sciences at the Microscale

5. Department of Chemical Physics

6. University of Science and Technology of China

7. Hefei 230026

8. National Synchrotron Radiation Laboratory

9. Hefei 230029

Abstract

Dissociative ionization of trifluoromethane (CHF₃) is investigated in the 13.9–18.0 eV energy range using the threshold photoelectron–photoion coincidence (TPEPICO) technique coupled to a vacuum ultraviolet synchrotron radiation source.

Funder

National Natural Science Foundation of China

National Basic Research Program of China

National Synchrotron Radiation Laboratory

University of Science and Technology of China

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2020/CP/D0CP01793K

Reference48 articles.