Dielectric metasurface-assisted cavity ring-down spectroscopy for thin-film circular dichroism analysis

Author:

Singh Ankit Kumar1ORCID,Lin Zhan-Hong1ORCID,Jiang Min1,Mayerhöfer Thomas G.12,Huang Jer-Shing12345ORCID

Affiliation:

1. Leibniz Institute of Photonic Technology, Member of Leibniz Health Technologies, Member of the Leibniz Centre for Photonics in Infection Research (LPI), Albert Einstein Straße 9, 07745 Jena, Germany

2. Institute of Physical Chemistry, Friedrich Schiller University Jena, Member of the Leibniz Centre for Photonics in Infection Research (LPI), Helmholtzweg 4, 07743 Jena, Germany

3. Abbe Center of Photonics, Friedrich Schiller University Jena, Member of the Leibniz Centre for Photonics in Infection Research (LPI), Helmholtzweg 4, 07743 Jena, Germany

4. Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan

5. Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan

Abstract

We propose the integration of a dielectric metasurface into evanescent wave cavity ring-down spectroscopy to enable ultrasensitive circular dichroism measurement of chiral thin film and chiral smaple at low concentrations using linearly polarized light.

Funder

European Commission

Freistaat Thüringen

Deutsche Forschungsgemeinschaft

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

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