Calculating small-angle scattering intensity functions from electron-microscopy images-Reference-Cited by-同舟云学术

Calculating small-angle scattering intensity functions from electron-microscopy images

Published:2022 Issue:26 Volume:12 Page:16656-16662
ISSN:2046-2069
Container-title:RSC Advances
language:en
Short-container-title:RSC Adv.

Author:

Yildirim Batuhan¹²³^ORCID,Washington Adam²^ORCID,Doutch James²,Cole Jacqueline M.¹²³^ORCID

Affiliation:

1. Cavendish Laboratory, Department of Physics, University of Cambridge, J. J. Thomson Avenue, Cambridge, CB3 0HE, UK

2. ISIS Neutron and Muon Source, STFC Rutherford Appleton Laboratory, Didcot, Oxfordshire, OX11 0QX, UK

3. Research Complex at Harwell, Rutherford Appleton Laboratory, Didcot, Oxfordshire, OX11 0FA, UK

Abstract

We outline procedures to calculate small-angle scattering (SAS) intensity functions from 2-dimensional electron-microscopy (EM) images for two types of scattering systems.

Funder

Royal Academy of Engineering

Science and Technology Facilities Council

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2022/RA/D2RA00685E

Reference28 articles.

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