Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples-Reference-Cited by-同舟云学术

Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples

Published:2015 Issue:10 Volume:30 Page:2107-2119
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

In Jung-Hwan¹²³,Kim Chan-Kyu¹²³,Jeong Sungho¹²³

Affiliation:

1. School of Mechatronics

2. Gwangju Institute of Science and Technology

3. Republic of Korea

Abstract

The precision of laser induced breakdown spectroscopy (LIBS) measurement is analyzed in consideration of both the shot noise of the detector and the shot-to-shot fluctuation noise of the laser plasma.

Funder

National Research Foundation of Korea

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2015/JA/C5JA00139K

Reference39 articles.

1. Quantitative analysis of CuIn1−xGaxSe2 thin films with fluctuation of operational parameters using laser-induced breakdown spectroscopy

2. Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

3. Laser induced breakdown spectroscopy for fast elemental analysis and sorting of metallic scrap pieces using certified reference materials