Energy dependent XPS measurements on thin films of a poly(vinyl methyl ether)/polystyrene blend concentration profile on a nanometer resolution to understand the behavior of nanofilms

Author:

Gawek Marcel1234,Madkour Sherif1234,Szymoniak Paulina1234ORCID,Radnik Jörg1234ORCID,Schönhals Andreas1234ORCID

Affiliation:

1. Bundesanstalt für Materialforschung und – prüfung (BAM) (Fachbereich 6.6)

2. Unter den Eichen 87

3. 12205 Berlin

4. Germany

Abstract

The composition of the surface layer in dependence from the distance of the polymer/air interface in thin films with thicknesses below 100 nm of a miscible polymer blends in a spatial region of a few nanometers is not investigated completely.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Royal Society of Chemistry (RSC)

Subject

Condensed Matter Physics,General Chemistry

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