Chemical selectivity in structure determination by the time dependent analysis of in situ XRPD data: a clear view of Xe thermal behavior inside a MFI zeolite
Author:
Affiliation:
1. Dipartimento di Scienze e Innovazione Tecnologica
2. Università del Piemonte Orientale ‘‘A. Avogadro’’ (Italy)
3. I-15121 Alessandria
4. Italy
5. Nova Res s.r.l.
6. Institute of Crystallography
7. Bari 70126
Abstract
PSD/PCA analysis of MED data allowed to enhance the chemical selectivity in X-ray powder diffraction and to obtain Xe substructure into MFI zeolite.
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2015/CP/C5CP02522B
Reference47 articles.
1. In Situ XAS and XRPD Parametric Rietveld Refinement To Understand Dealumination of Y Zeolite Catalyst
2. Monitoring the Formation of H-MCM-22 by a Combined XRPD and Computational Study of the Decomposition of the Structure Directing Agent
3. A Combined High-Resolution X-ray Powder Diffraction, Computational, and XPS Study of the Local Structure of Extra-Framework Copper Ions in Over-Exchanged Cu-MCM22 Zeolite
4. Iron Location in Fe-Silicalites by Synchrotron Radiation Single Crystal X-ray Diffraction
5. Single-Crystal Synchrotron Radiation X-ray Diffraction Study of B and Ga Silicalites Compared to a Purely Siliceous MFI: A Discussion of the Heteroatom Distribution
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