Identifying the acceptor state in NiO hole collection layers: direct observation of exciton dissociation and interfacial hole transfer across a Fe2O3/NiO heterojunction-Reference-Cited by-同舟云学术

Identifying the acceptor state in NiO hole collection layers: direct observation of exciton dissociation and interfacial hole transfer across a Fe2O3/NiO heterojunction

Published:2018 Issue:38 Volume:20 Page:24545-24552
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Biswas Somnath¹²³⁴^ORCID,Husek Jakub¹²³⁴^ORCID,Londo Stephen¹²³⁴,Fugate Elizabeth A.¹²³⁴,Baker L. Robert¹²³⁴^ORCID

Affiliation:

1. The Ohio State University

2. Department of Chemistry and Biochemistry

3. Columbus

4. USA

Abstract

Ultrafast XUV reflection–absorption identifies interfacial charge transfer mechanism and the hole acceptor state in a Fe₂O₃/NiO model heterojunction

Funder

Basic Energy Sciences

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2018/CP/C8CP04502J

Reference58 articles.

1. p-Type semiconducting nickel oxide as an efficiency-enhancing anode interfacial layer in polymer bulk-heterojunction solar cells

2. NiO as an Inorganic Hole-Transporting Layer in Quantum-Dot Light-Emitting Devices

3. An ultra-thin, un-doped NiO hole transporting layer of highly efficient (16.4%) organic–inorganic hybrid perovskite solar cells

4. Nickel Oxide Hole Injection/Transport Layers for Efficient Solution-Processed Organic Light-Emitting Diodes

5. NiOx Hole Transport Layer for Perovskite Solar Cells with Improved Stability and Reproducibility

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