Effect of low thermal budget annealing on surface passivation of silicon by ALD based aluminum oxide films

Author:

Vandana Vandana1234,Batra Neha1234,Gope Jhuma1234,Singh Rajbir1234,Panigrahi Jagannath1234,Tyagi Sanjay1234,Pathi P.1234,Srivastava S. K.1234,Rauthan C. M. S.1234,Singh P. K.1234

Affiliation:

1. Silicon Solar Cell Group

2. (Network of Institutes for Solar Energy)

3. CSIR - National Physical Laboratory

4. New Delhi-110012, India

Abstract

Silicon surface passivation is studied using Al2O3 films by the thermal ALD process. A surface recombination velocity of below 10 cm s−1 is realized for short annealing times (∼100 s). As-deposited and annealed films show the presence of positive fixed charges.

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

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