Sub-nm resolution depth profiling of the chemical state and magnetic structure of thin films by a depth-resolved X-ray absorption spectroscopy technique-Reference-Cited by-同舟云学术

Sub-nm resolution depth profiling of the chemical state and magnetic structure of thin films by a depth-resolved X-ray absorption spectroscopy technique

Published:2012 Issue:30 Volume:14 Page:10477
ISSN:1463-9076
Container-title:Physical Chemistry Chemical Physics
language:en
Short-container-title:Phys. Chem. Chem. Phys.

Author:

Amemiya Kenta

Publisher

Royal Society of Chemistry (RSC)

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://pubs.rsc.org/en/content/articlepdf/2012/CP/C2CP41085K

Reference41 articles.

1. Development of a depth-resolved x-ray magnetic circular dichroism: application to Fe/Cu(100) ultrathin films

2. Direct observation of magnetic depth profiles of thin Fe films on Cu(100) and Ni/Cu(100) with the depth-resolved x-ray magnetic circular dichroism

3. Magnetic live surface layers in Fe/Cu(100)

4. Magnetic phases of ultrathin Fe grown on Cu(100) as epitaxial wedges

5. Magnetic moments of fcc Fe overlayers on Cu(100) and Co(100)

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