Fast IR laser mapping ellipsometry for the study of functional organic thin films
Author:
Affiliation:
1. Leibniz-Institut für Analytische Wissenschaften – ISAS – e. V.
2. 12489 Berlin
3. Germany
4. SENTECH Instruments GmbH
5. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH
6. Institut für Silizium-Photovoltaik
Abstract
Infrared laser ellipsometry is advanced for fast homogeneity mapping studies of functional organic thin films.
Publisher
Royal Society of Chemistry (RSC)
Subject
Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2015/AN/C4AN01853B
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