Nanoparticle characterization based on STM and STS-Reference-Cited by-同舟云学术

Nanoparticle characterization based on STM and STS

Published:2015 Issue:4 Volume:44 Page:970-987
ISSN:0306-0012
Container-title:Chemical Society Reviews
language:en
Short-container-title:Chem. Soc. Rev.

Author:

Kano Shinya¹²³⁴,Tada Tsukasa¹²³⁴,Majima Yutaka¹²³⁴⁵

Affiliation:

1. Materials and Structures Laboratory

2. Tokyo Institute of Technology

3. Yokohama 226-8503

4. Japan

5. Department of Printed Electronics Engineering

Abstract

Scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) can characterize intriguing nanoparticle properties towards solid-state nanodevices.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2015/CS/C4CS00204K

Reference228 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Theory of the scanning tunneling microscope

3. Spectroscopy of single atoms in the scanning tunneling microscope

4. Tunneling spectroscopy of the Si(111)2 × 1 surface

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