Building a depletion-region width modulation model and realizing memory characteristics in PN heterostructure devices

Author:

Guo Xing1,Li Xinmiao1,Wang Ruixiao1,Zhu Wenhui1,Wang Liancheng1,Zhang Lei1ORCID

Affiliation:

1. State Key Laboratory of High Performance Complex Manufacturing, College of Mechanical and Electrical Engineering, Central South University, Changsha, 410000, China

Abstract

A new depletion-region width modulation model is proposed to realize memory characteristics, and the coexistence of memristive and memcapacitive behaviors is demonstrated in p-CuAlO2/n-ZnO, p+-Si/n-ZnO and p-NiO/n-ZnO heterostructure devices.

Funder

National Natural Science Foundation of China

Natural Science Foundation of Hunan Province

Publisher

Royal Society of Chemistry (RSC)

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